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| ==Presentations of Published Papers== | | ==Presentations of Published Papers== |
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| + | {| style="border:2px solid #abd5f5; background:#f1f5fc;" |
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| + | | |
| + | {| |
| + | |- valign=top |
| + | | width="100" |'''title / type''': |
| + | | width="550"| Yield Analysis of Nano-Crossbar Arrays for Uniform and Clustered Defect Distributions / Presentation |
| + | |- valign="top" |
| + | | width="1" | '''presenter(s) - attendant(s)''': |
| + | | Mustafa Altun (ITU) and Onur Tunali (ITU) |
| + | |- valign=top |
| + | | '''presented at''': |
| + | | width="550"| [http://icecs2017.org/ IEEE International Conference on Electronics Circuits and Systems (ICECS)], Batumi, Georgia, 2017. |
| + | |- valign="top" |
| + | | '''people reached''': |
| + | |Over 200 attendees, mostly researchers, both from academia and industry. |
| + | |
| + | |} |
| + | | align="center" width="70" | |
| + | <span class="plainlinks"> |
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| + | [[File:PPT.jpg|60px|link=http://www.nanoxcomp.itu.edu.tr/images/6/62/Tunali_Altun_Nano_Crossbar_Yield_Analysis.pptx]] |
| + | </span> |
| + | <br> [http://www.nanoxcomp.itu.edu.tr/images/6/62/Tunali_Altun_Nano_Crossbar_Yield_Analysis.pptx Slides] |
| + | |} |
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| {| style="border:2px solid #abd5f5; background:#f1f5fc;" | | {| style="border:2px solid #abd5f5; background:#f1f5fc;" |