Research

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Our research aims to develop novel ways of computing, circuit design, and reliability for electronic circuits and systems. Our research mainly targets emerging technologies and new computing paradigms.
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We aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. Our objectives are 1) synthesizing Boolean functions with area optimization; 2) achieving fault tolerance; 3) performing performance optimization by considering area, delay, power, and accuracy; 4) implementing arithmetic and memory elements; and 5) realizing a synchronous state machine.  
  
 
<div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div>
 
<div style="float:center; font-size:110%; font-weight:bold; clear:both; padding:0; margin:0.0em;">__TOC__</div>
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<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Computing with Nano-Crossbar Arrays </h2>
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<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Logic Synthesis </h2>
  
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
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Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures, and fabricated by exploiting self-assembly as opposed to purely using lithography based conventional and relatively costly CMOS fabrication techniques. Currently, nano-crossbar arrays are fabricated such that each crosspoint can be used as a conventional electronic component such as a diode, a FET, or a switch. This is a unique opportunity that allows us to integrate well developed conventional circuit design techniques into nano-crossbar arrays. Motivated by this, we aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer.
 
 
 
[[Image:Research-nanoarray-1.png|center|none|800px|link=]]
 
 
<h3>
 
Synthesis</h3>
 
 
We study '''implementation of Boolean functions''' with nano-crossbar arrays where each crosspoint behaves as a diode, a FET, and a four-terminal switch. For these three types, we give array size formulations for a given Boolean function. Additionally, we focus on four-terminal switch based implementations and propose an algorithm that implements Boolean functions with '''optimal array sizes'''.
 
We study '''implementation of Boolean functions''' with nano-crossbar arrays where each crosspoint behaves as a diode, a FET, and a four-terminal switch. For these three types, we give array size formulations for a given Boolean function. Additionally, we focus on four-terminal switch based implementations and propose an algorithm that implements Boolean functions with '''optimal array sizes'''.
  
<!-- [[Image:Research-1.png|center|none|800px|link=]] -->
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[[Image:nanoarray_logic_synthesis.png|center|none|800px|link=]]
<h3>
+
Fault Tolerance</h3>
+
  
We examine reconfigurable crossbar arrays by considering randomly occurred '''stuck-open and stuck-closed crosspoint faults'''. In the presence of '''permanent''' faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. In the presence of '''transient''' faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions
 
  
 
<!-- [[Image:Research-2.png|center|none|800px|link=]] -->
 
<!-- [[Image:Research-2.png|center|none|800px|link=]] -->
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{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
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|
 
|
{|
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{|  
 
|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays]]
+
| width="450"|[[Media:Bernasconi_EtAl_Synthesis_on_Switching_Lattices_D_Reducible.pdf | Synthesis on Switching Lattices of Dimension-Reducible Boolean Functions]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Onur Tunali and [[Mustafa Altun]]
+
| Anna Bernasconi, Valentina Ciriani, Luca Frontini, and Gabriella Trucco
|- valign="top"
+
|- valign=top
| '''accepted&nbsp;in''':
+
| [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of<br> Integrated Circuits and Systems], 2016.
+
|- valign="top"
+
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.nanoarch.org/ IEEE/ACM International Symposium on Nanoscale Architectures<br> (NANOARCH)], Boston, USA, 2015.
+
| width="450"| [http://ati.ttu.ee/vlsi-soc2016/ International Conference on Very Large Scale Integration (VLSI-SoC)], Tallinn, Estonia, 2016
 
|}
 
|}
| align=center width="70" |
+
 
 +
| align=center width="70" |  
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.nanoxcomp.itu.edu.tr/images/d/d5/Bernasconi_EtAl_Synthesis_on_Switching_Lattices_D_Reducible.pdf]]</span>
 
<br>
 
<br>
[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Paper]]
+
[[Media:Bernasconi_EtAl_Synthesis_on_Switching_Lattices_D_Reducible.pdf | Paper]]
| align="center" width="70" |
+
| align="center" width="70" |  
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/f/f9/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pptx]]
+
[[File:PDF.png|65px|link=http://www.nanoxcomp.itu.edu.tr/images/a/a2/Bernasconi_EtAl_Synthesis_on_Switching_Lattices_D_Reducible_SLIDES.pdf]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/f/f9/Tunali_Altun_Defect_Tolerance_in_Diode_FET_and_Four-Terminal_Switch_based_Nano-Crossbar_Arrays.pptx Slides]
+
<br> [[Media:Bernasconi_EtAl_Synthesis_on_Switching_Lattices_D_Reducible_SLIDES.pdf | Slides]]
 +
 
 
|}
 
|}
  
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|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Dan Alexandrescu, [[Mustafa Altun]], Lorena Anghel, Anna Bernasconi,<br> Valentina Ciriani, and Mehdi Tahoori
+
| width="450"| Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, and Mehdi Tahoori
 
|- valign=top
 
|- valign=top
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://dsd-seaa2016.cs.ucy.ac.cy/index.php Euromicro Conference on Digital System Design (DSD)],<br> Limassol, Cyprus, 2016.
+
| width="450"| [http://dsd-seaa2016.cs.ucy.ac.cy/index.php Euromicro Conference on Digital System Design (DSD)], Limassol, Cyprus, 2016.
 
|}
 
|}
  
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</span>
 
</span>
 
<br> [[Media:Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer_SLIDES.pdf | Slides]]
 
<br> [[Media:Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer_SLIDES.pdf | Slides]]
|}
 
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
 
|
 
{|
 
|- valign=top
 
| width="100" |'''title''':
 
| width="450"|[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Logic Synthesis for Switching Lattices]]
 
|- valign="top"
 
| '''authors''':
 
| [[Mustafa Altun]] and [http://cadbio.com/wiki/index.php/Marc_Riedel Marc Riedel]
 
|- valign="top"
 
| '''appeared&nbsp;in''':
 
| [http://www.computer.org/portal/web/tc IEEE Transactions on Computers], <br>Vol. 61, Issue 11, pp. 1588&ndash;1600, 2012.
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| [http://www.dac.com Design Automation Conference (DAC)], Anaheim, USA, 2010.
 
|}
 
| align=center width="70" |
 
<span class="plainlinks">
 
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/ca/Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf]]</span>
 
<br>
 
[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Paper]]
 
| align="center" width="70" |
 
<span class="plainlinks">
 
 
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt]]
 
</span>
 
<br> [http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt Slides]
 
 
|}
 
|}
  
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|- valign=top
 
|- valign=top
| width="696" |'''Funding Projects'''
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| width="696" |'''Developed Tools'''
 
|}
 
|}
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
  
 
|
 
|
{|
+
{|  
 +
|- valign=top
 +
| width="100" |'''title''':
 +
| width="524"|[[Media:Morgul_Altun_Optimal_Synthesis_Tools.zip | Optimal Synthesis Tool]]
 
|- valign="top"
 
|- valign="top"
| width="140" |'''title''':
+
| '''authors''':
| width="558"|Synthesis and Performance Optimization of a Switching Nano-Crossbar Computer
+
| Ceylan Morgul and Mustafa Altun
 
|- valign="top"
 
|- valign="top"
| '''agency & program''':
+
| '''description''':
| [http://ec.europa.eu/research/mariecurieactions/about-msca/actions/rise/index_en.htm European Union/European Commission H2020 MCSA <br> Research and Innovation Staff Exchange Program (RISE)]
+
| width="524"| Two optimal synthesis tools Tool-1 and Tool-2 are developed in Matlab  and Python, respectively. Both tools aim to synthesize a given target Boolean functions with an optimal size of four-terminal switch based arrays . 
|- valign="top"
+
|}
| '''budget''':
+
| align=center width="70" |
| 724.500 EURO
+
<span class="plainlinks">
|- valign="top"
+
[[File:ZIP.png|65px|link=http://www.nanoxcomp.itu.edu.tr/images/b/b3/Morgul_Altun_Optimal_Synthesis_Tools.zip]]</span>
| '''duration''':
+
<br>
| 2015-2019
+
[[Media:Morgul_Altun_Optimal_Synthesis_Tools.zip | Tool]]
 
|}
 
|}
 
   
 
   
 
|}
 
|}
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
 
  
|
 
{|
 
|- valign=top
 
| width="140" |'''title''':
 
| width="558"|Synthesis and Reliability Analysis of Nano Switching Arrays
 
|- valign="top"
 
| '''agency & program''':
 
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-3501-kariyer-gelistirme-programi TUBITAK Career Program (3501)]
 
|- valign="top"
 
| '''budget''':
 
| 189.509 TL
 
|- valign="top"
 
| '''duration''':
 
| 2014-2017
 
|}
 
 
|}
 
|}
  
|}
 
|}
 
 
|}
 
|}
  
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|-
 
|-
 
| colspan="2" style="background:#8FBCBF; text-align:center; padding:1px; border-bottom:1px #8FBCBF solid;" |
 
| colspan="2" style="background:#8FBCBF; text-align:center; padding:1px; border-bottom:1px #8FBCBF solid;" |
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Reversible Circuit Design </h2>
+
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Fault Tolerance </h2>
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
  
Unlike conventional logic gates, reversible logic gates do not have “don’t-care” conditions. It means that an error occurring in any node of a reversible circuit is always seen at the output that gives a unique opportunity for error detecting/correcting. Motivated by this, we implement error tolerant reversible circuit blocks by exploiting parity preserving logic and Hamming codes. We aim to design, fabricate, and test a fault-aware 8-bit reversible microprocessor for applications requiring high accuracy and reliability including aerospace, military, and medical applications.
+
We examine reconfigurable crossbar arrays by considering randomly occurred '''stuck-open and stuck-closed crosspoint faults'''. In the presence of '''permanent''' faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. In the presence of '''transient''' faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions
  
[[Image:Research-reversible-1.png|center|none|800px|link=]]
+
Since '''density''' feature of crossbar architectures is the main attracting point, we perform a detailed yield analysis by considering both uniform and non-uniform defect distributions.
 
+
We formalize an approximate successful mapping probability metric for uniform distributions
<h3>
+
and determine '''area overheads'''.
  
Synthesis and Optimization</h3>
+
[[Image:nanoarray_fault_tolerance.png|center|none|500px|link=]]
  
We propose a fast synthesis algorithm that implements any given reversible Boolean function with quantum gates. Instead of an exhaustive search on every given function, our algorithm creates a library of '''essential functions''' and performs '''sorting'''. As an example, to implement 4 bit circuits we only use 120 essential functions out of all 20922789888000 functions. We also perform optimization for both '''reversible and quantum circuit costs''' by considering adjacent gate pairs.
 
  
 
<!-- [[Image:Research-4.png|center|none|800px|link=]] -->
 
<!-- [[Image:Research-4.png|center|none|800px|link=]] -->
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| width="696" |'''Selected Publications'''
 
| width="696" |'''Selected Publications'''
 
|}
 
|}
 +
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 +
|
 +
{|
 +
|- valign=top
 +
| width="100" |'''title''':
 +
| width="524"|[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays]]
 +
|- valign="top"
 +
| '''authors''':
 +
| Onur Tunali and Mustafa Altun
 +
|- valign="top"
 +
| '''appeared&nbsp;in''':
 +
| width="524" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems], Vol. 36, Issue 5, pp. 747–760, 2017.
 +
|}
 +
| align=center width="70" |
 +
<span class="plainlinks">
 +
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/cc/Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf]]</span>
 +
<br>
 +
[[Media:Tunali_Altun_Permanent_and_Transient_Fault_Tolerance_for_Reconfigurable_Nano-Crossbar_Arrays.pdf | Paper]]
 +
|}
 +
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
  
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|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Susam_Altun_Fast_Synthesis_of_Reversible_Circuits_using_a_Sorting_Algorithm_and_Optimization.pdf| Fast Synthesis of Reversible Circuits using a Sorting Algorithm and Optimization]]
+
| width="450"|[[Media:Tunali_Altun_Nano_Crossbar_Yield_Analysis.pdf| Yield Analysis of Nano-Crossbar Arrays for Uniform and Clustered Defect Distributions]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Omercan Susam and [[Mustafa Altun]]
+
| Onur Tunali and [[Mustafa Altun]]
|- valign="top"
+
| '''accepted&nbsp;in''':
+
| [http://www.oldcitypublishing.com/journals/mvlsc-home/ Journal of Multiple-Valued Logic and Soft Computing], 2016.
+
 
|- valign="top"
 
|- valign="top"
| '''presented&nbsp;at''':
+
| '''accepted&nbsp;at''':
| [http://www.ieee-icecs2014.org/ IEEE International Conference on Electronics Circuits and Systems<br> (ICECS)], Marseille, France, 2014.
+
| width="450"| [http://icecs2017.org/ IEEE International Conference on Electronics Circuits and Systems (ICECS)], Batumi, Georgia, 2017.
 
|}
 
|}
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/cd/Susam_Altun_Fast_Synthesis_of_Reversible_Circuits_using_a_Sorting_Algorithm_and_Optimization.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/6/6b/Tunali_Altun_Nano_Crossbar_Yield_Analysis.pdf]]</span>
 
<br>
 
<br>
[[Media:Susam_Altun_Fast_Synthesis_of_Reversible_Circuits_using_a_Sorting_Algorithm_and_Optimization.pdf | Paper]]
+
[[Media:Tunali_Altun_Nano_Crossbar_Yield_Analysis.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/d0/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pptx]]
+
[[File:PPT.jpg|60px|link=]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/d/d0/Susam_Altun_An_Efficient_Algorithm_to_Synthesize_Quantum_Circuits_and_Optimization.pptx Slides]
+
<br> Slides
 
|}
 
|}
  
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|- valign=top
 
|- valign=top
| width="696" |'''Funding Projects'''
+
| width="696" |'''Developed Tools'''
 
|}
 
|}
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
  
 
|
 
|
{|
+
{|  
 +
|- valign=top
 +
| width="100" |'''title''':
 +
| width="524"|[[Media:Tunali_Altun_Fault_Tolerant_Logic_Mapping_Tool.zip | Fault Tolerant Logic Mapping Tool]]
 
|- valign="top"
 
|- valign="top"
| width="140" |'''title''':
+
| '''authors''':
| width="558"|Implementation of a Fault-Aware 8-Bit Reversible Microprocessor
+
| Onur Tunali and Mustafa Altun
 
|- valign="top"
 
|- valign="top"
| '''agency & program''':
+
| '''description''':
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1002-hizli-destek-programi TUBITAK Short Term R&D Funding Program (1002)]
+
| width="524"| The tool is developed in Matlab. It aims to map logic funtions into fault crossbars such that each crosspoint has an independent fault probability up to 20%.
|- valign="top"
+
| '''budget''':
+
| 30.000 TL
+
|- valign="top"
+
| '''duration''':
+
| 2016-2017
+
 
|}
 
|}
+
| align=center width="70" |
 +
<span class="plainlinks">
 +
[[File:ZIP.png|65px|link=http://www.nanoxcomp.itu.edu.tr/images/1/16/Tunali_Altun_Fault_Tolerant_Logic_Mapping_Tool.zip]]</span>
 +
<br>
 +
[[Media:Tunali_Altun_Fault_Tolerant_Logic_Mapping_Tool.zip | Tool]]
 
|}
 
|}
 +
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
  
 
|
 
|
{|
+
{|  
 
|- valign=top
 
|- valign=top
| width="140" |'''title''':
+
| width="100" |'''title''':
| width="558"|Quantum Circuit Design and Computation
+
| width="524"|[[Media:Tunali_Altun_Yield_Analysis_Tool.zip | Yield Analysis Tool]]
 
|- valign="top"
 
|- valign="top"
| '''agency & program''':
+
| '''authors''':
| [http://bap.itu.edu.tr/ Istanbul Technical University Research Support Program (ITU-BAP)]
+
| Onur Tunali and Mustafa Altun
 
|- valign="top"
 
|- valign="top"
| '''duration''':
+
| '''description''':
| 2014-2015, ''completed''
+
| width="524"| The tool is developed in Matlab. This tool calculates the required crossbar size in advance according to a given logic function and a defect rate. Tool accepts two parameters, logic function file and defect rate as inputs and returns the size of crossbar.
 
|}
 
|}
+
| align=center width="70" |
 +
<span class="plainlinks">
 +
[[File:ZIP.png|65px|link=http://www.nanoxcomp.itu.edu.tr/images/1/15/Tunali_Altun_Yield_Analysis_Tool.zip]]</span>
 +
<br>
 +
[[Media:Tunali_Altun_Yield_Analysis_Tool.zip | Tool]]
 
|}
 
|}
  
 
|}
 
|}
 +
 
|}
 
|}
 +
 
|}
 
|}
  
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|-
 
|-
 
| colspan="2" style="background:#8FBCAF; text-align:center; padding:1px; border-bottom:1px #8FBCAF solid;" |
 
| colspan="2" style="background:#8FBCAF; text-align:center; padding:1px; border-bottom:1px #8FBCAF solid;" |
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Stochastic Circuit Design </h2>
+
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Performance Modeling and Analysis </h2>
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
  
<h3>
+
We introduce an '''accurate capacitor-resistor model''' for nano-crossbar arrays that is to be used for '''power/delay/area''' performance analysis and optimization. In order to find capacitor and resistor values, we investigate upper/lower value limits for technology dependent parameters including doping concentration, nanowire dimension, pitch size, and layer thickness. We also use different fan-out capacitors to test the integration capability of these technologies.
Accurate Arithmetic Implementations</h3>
+
  
We propose a method to overcome the main drawback in stochastic computing, '''low accuracy''' or related '''long computing times'''. Our method manipulates stochastic bit streams with the aid of feedback mechanisms. We implement error-free arithmetic multiplier and adder circuits by considering performance parameters area, delay, and accuracy.
+
[[Image:nanoarray_RC_modeling.png|center|none|500px|link=]]
  
[[Image:Research-stochastic-1.png|center|none|800px|link=]]
 
  
 
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{| style="border:1px solid #abd5f5; background:#d0e5f5; padding:0.2em 0.5em; font-weight:bold;"
  
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{|
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{|  
 
|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pdf | Accurate Synthesis of Arithmetic Operations with Stochastic Logic]]
+
| width="450"|[[Media:Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pdf | Power-Delay-Area Performance Modeling and Analysis for Nano-Crossbar Arrays]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Ensar Vahapoglu and [[Mustafa Altun]]
+
| Ceylan Morgul, Furkan Peker, and Mustafa Altun
 
|- valign=top
 
|- valign=top
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.isvlsi.org/ IEEE Computer Society Annual Symposium on VLSI (ISVLSI)],<br> Pittsburgh, USA, 2016.
+
| width="450"| [http://www.isvlsi.org/ IEEE Computer Society Annual Symposium on VLSI (ISVLSI)], Pittsburgh, USA, 2016.
 
|}
 
|}
  
| align=center width="70" |
+
| align=center width="70" |  
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d6/Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/8/8f/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pdf]]</span>
 
<br>
 
<br>
[[Media:Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pdf | Paper]]
+
[[Media:Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pdf | Paper]]
| align="center" width="70" |
+
| align="center" width="70" |  
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/d6/Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pptx]]
+
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/5/5a/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/d/d6/Vahapoglu_Altun_Accurate_Synthesis_of_Arithmetic_Operations_with_Stochastic_Logic.pptx Poster]
+
<br> [http://www.ecc.itu.edu.tr/images/5/5a/Morgul_Peker_Altun_Power-Delay-Area_Performance_Modeling_and_Analysis_for_Nano-Crossbar_Arrays.pptx Poster]
 +
|}
 
|}
 
|}
  
 
| style="border:1px solid transparent;" |
 
| style="border:1px solid transparent;" |
 
<!--        PROJE      -->
 
<!--        PROJE      -->
| class="MainPageBG" style="width:50%; border:0px solid #A9A9A9; vertical-align:top;"|
 
{| id="mp-right" style="width:100%; vertical-align:top;"
 
  
|
 
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#d0e5f5; padding:0.2em 0.5em; font-weight:bold;"
 
 
|- valign=top
 
| width="696" |'''Funding Projects'''
 
|}
 
 
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
 
 
|
 
{|
 
|- valign="top"
 
| width="140" |'''title''':
 
| width="558"|Implementation of Accurate Stochastic Circuit Blocks and their Applications for Printed/Flexible Electronic Systems
 
|- valign="top"
 
| '''agency & program''':
 
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1001-bilimsel-ve-teknolojik-arastirma-projelerini-destekleme-pr TUBITAK Scientific and Technological Research Projects Funding Program (1001)]
 
|- valign="top"
 
| '''budget''':
 
| 276.700 TL
 
|- valign="top"
 
| '''duration''':
 
| 2017-2020
 
|}
 
|}
 
|}
 
|}
 
 
|}
 
|}
 
|}
 
|}
  
<!--        RELIABILITY    -->
 
  
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
|-
 
|-
| colspan="2" style="background:#8FBC9F; text-align:center; padding:1px; border-bottom:1px #8FBC9F solid;" |
+
| colspan="2" style="background:#8FBC9F; text-align:center; padding:1px; border-bottom:1px #8FBCAF solid;" |
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Reliability of Electronic Products </h2>
+
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Technology Development and Performance Optimization </h2>
 +
 
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
  
The rapid developments in electronics, especially in the last decade, have elevated the importance of electronics reliability. Conventionally used accelerated reliability tests have lost their significance; time consuming and expensive feature of these tests is against the demands of today's very rapid electronic product cycles. In this study, we propose less costly, yet accurate, reliability prediction techniques using field return data, new accelerated test methodologies, and physics of failure based simulations. We cooperate with one of the Europe’s largest household appliance companies [http://www.arcelik.com.tr/default.aspx?lang=en-US Arçelik A.Ş.].
+
Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures. Computing with crossbar arrays is achieved by its crosspoints behaving as switches, either two-terminal or four-terminal. Depending on the technology used, a two-terminal switch behaves as a diode, a resistive/memristive switch, or a field effect transistor (FET). On the other hand, a four-terminal switch has a unique behavior. While there have been many different technologies proposed for two-terminal switch based arrays, technology development for four-terminal switch based arrays, called switching lattices, has recently started.
  
[[Image:Research-3.png|center|none|800px|link=]]
+
For both two-terminal and four-terminal switch based arrays, we aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. We also aim to develeop CMOS-compatible technologies for crossbar arrays, specifically for switching lattices.
 +
 
 +
[[Image:Research_nano-2019.png|center|none|800px|link=]]
  
 
<h3>
 
<h3>
Reliability Analysis and Prediction with Field Data</h3>
+
Technology Development</h3>
  
We propose an '''accurate reliability prediction''' model for high-volume electronic products throughout their warranty periods by using field return data. Our model is constructed on a Weibull-exponential hazard rate scheme by using the '''proposed change point detection method''' based on backward and forward data analysis. Our prediction model can make a '''36-month''' (full warranty) reliability prediction of an electronic board with using its field data as short as '''3 months'''.
+
Although a four-terminal switch based array offers a '''significant area advantage''', in terms of the number of switches, compared to the ones having two-terminal switches, its realization at the technology level needs
 +
further justifications and raises a number of questions about its
 +
feasibility. We answer these questions. First, by using
 +
three dimensional technology computer-aided design (TCAD)
 +
simulations, we show that '''four-terminal switches can be directly implemented with the CMOS technology'''. For this purpose, we
 +
try different semiconductor gate materials in different formations
 +
of geometric shapes. Then, by fitting the TCAD simulation data
 +
to the standard CMOS current-voltage equations, we develop a
 +
Spice model of a four-terminal switch. Finally, we successfully
 +
perform '''Spice circuit simulations on four-terminal switches''' with
 +
different sizes.
 +
[[Image:research_lattice_technology.png|center|none|800px|link=]]
  
 
<h3>
 
<h3>
Degradation Processes in Varistors</h3>
+
Performance Optimization</h3>
  
We investigate different degradation mechanisms of ZnO varistors. We propose a model showing how the varistor voltage Vv changes by time for different stress levels. For this purpose, accelerated degradation tests are applied for different AC current levels; then voltage values are measured. Different from the common practice in the literature that considers a degradation with only decreasing Vv values, we demonstrate '''either an increasing or a decreasing trend in the Vv parameter'''.
+
We study crossbar arrays including the memristive ones. We
 
+
propose a '''defect-tolerant logic synthesis algorithms by considering area, delay, and power costs''' of the arrays.
<h3>
+
<!-- [[Image:Research-2.png|center|none|800px|link=]] -->
Calibrated Accelerated Life Testing</h3>
+
  
Dramatic decrease in failure rates for electronic products makes conventional accelerated life tests ('''ALT''') extremely time consuming and costly. Recently proposed calibrated accelerated life tests ('''CALT''') aim to use fewer samples than those used in ALT.  We thoroughly compare ALT and CALT by considering the effects of failure rate, acceleration factor, and stress level on the required test time.
 
  
 
<!--        YAYIN      -->
 
<!--        YAYIN      -->
Line 438: Line 388:
 
|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf| A Change-Point based Reliability Prediction Model using Field Return Data]]
+
| width="450"|[[Media: Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf| Realization of Four-Terminal Switching Lattices: Technology Development and Circuit Modeling]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| [[Mustafa Altun]] and Vehbi Comert
+
| width="450"| Serzat Safaltin, Oguz Gencer, Ceylan Morgul, Levent Aksoy, Sebahattin Gurmen, Csaba Andras Moritz, and [[Mustafa Altun]]
|- valign=top
+
| '''accepted&nbsp;in''':
+
| [http://www.journals.elsevier.com/reliability-engineering-and-system-safety Reliability Engineering and System Safety], 2016.
+
 
|- valign=top
 
|- valign=top
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://rams.org/ Reliability and Maintainability Symposium (RAMS)],<br> Palm Harbor, USA, 2015.
+
| width="450"| [http://www.date-conference.com/ Design, Automation and Test in Europe (DATE)], Florence, Italy, 2019.
 
|}
 
|}
  
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/1/16/Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/2/2c/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf]]</span>
 
<br>
 
<br>
[[Media:Altun_Comert_A_Change-Point_based_Reliability_Prediction_Model_using_Field_Return_Data.pdf | Paper]]
+
[[Media:Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx]]
+
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/7/71/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/a/a7/Comert_Altun_Nadar_Erturk_Warranty_Forecasting_of_Electronic_Boards_using_Short-term_Field_Data.pptx Slides]
+
<br> [http://www.ecc.itu.edu.tr/images/7/71/Safaltin_EtAl_Technology_Development_for_Switching_Lattices.pptx Slides]
 
|}
 
|}
  
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
 
|
 
|
 
{|
 
{|
 
|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf | Effects of ZnO Varistor Degradation on the Overvoltage Protection Mechanism of Electronic Boards]]
+
| width="450"|[[Media:Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf | Defect Tolerant Logic Synthesis for Memristor Crossbars with Performance Evaluation]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Hadi Yadavari, Burak Sal, [[Mustafa Altun]], Ertunc Erturk, and Baris Ocak
+
| Onur Tunali and [[Mustafa Altun]]
 +
|- valign="top"
 +
| '''appeared&nbsp;in''':
 +
| width="450" | [http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=40 IEEE Micro], Vol. 38, Issue 5, pp. 22&ndash;31, 2018.
 
|- valign="top"
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://esrel2015.ethz.ch/ European Safety and Reliability Conference (ESREL)],<br> Zurich, Switzerland, 2015.
+
| width="450"| [http://www.date-conference.com/ Design, Automation and Test in Europe (DATE)], Dresden, Germany, 2018.
 
|}
 
|}
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/d7/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/d/db/Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf]]</span>
 
<br>
 
<br>
[[Media:Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pdf | Paper]]
+
[[Media:Tunali_Morgul_Altun_Defect_Tolerant_Memristor_Crossbars.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/d/de/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pptx]]
+
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/b/b8/Tunali_Altun_Logic_Synthesis_and_Defect_Tolerance_for_Memristive_Crossbars.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/d/de/Yadavari_EtAl_Effects_of_ZnO_Varistor_Degradation_on_the_Overvoltage_Protection_Mechanism_of_Electronic_Boards.pptx Slides]
+
<br> [http://www.ecc.itu.edu.tr/images/b/b8/Tunali_Altun_Logic_Synthesis_and_Defect_Tolerance_for_Memristive_Crossbars.pptx Slides]
 
|}
 
|}
  
Line 496: Line 445:
 
|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf | Extensive Investigation of Calibrated Accelerated Life Testing (CALT) in Comparison with Classical Accelerated Life Testing (ALT)]]
+
| width="450"|[[Media:Altun_EtAl_Synthesis_and_Testing_for_Switching_Nano_Crossbar_Arrays.pdf | Logic Synthesis and Testing Techniques for Switching Nano-Crossbar Arrays]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| Burak Sal and [[Mustafa Altun]]
+
| width="450"| Dan Alexandrescu, [[Mustafa Altun]], Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, and Mehdi Tahoori
 +
|- valign=top
 +
| '''appeared&nbsp;in''':
 +
| width="450" | [http://www.journals.elsevier.com/microprocessors-and-microsystems/ Microprocessors and Microsystems], Vol. 54, pp. 14&ndash;25, 2017.
 
|- valign="top"
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://esrel2015.ethz.ch/ European Safety and Reliability Conference (ESREL)],<br> Zurich, Switzerland, 2015.
+
| width="450"| [http://dsd-seaa2016.cs.ucy.ac.cy/index.php Euromicro Conference on Digital System Design (DSD)], Limassol, Cyprus, 2016.
 
|}
 
|}
 +
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/0/07/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/0/0a/Altun_EtAl_Synthesis_and_Testing_for_Switching_Nano_Crossbar_Arrays.pdf]]</span>
 
<br>
 
<br>
[[Media:Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pdf | Paper]]
+
[[Media:Altun_EtAl_Synthesis_and_Testing_for_Switching_Nano_Crossbar_Arrays.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/a/a8/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pptx]]
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/7/7f/Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer_SLIDES.pdf]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/a/a8/Sal_Altun_Extensive_Investigation_of_CALT_in_Comparison_with_ALT.pptx Slides]
+
<br> [[Media:Altun_EtAl_Synthesis_and_Performance_Optimization_of_a_Switching_Nano-crossbar_Computer_SLIDES.pdf | Slides]]
 
|}
 
|}
|}
 
| style="border:1px solid transparent;" |
 
<!--        PROJE      -->
 
| class="MainPageBG" style="width:50%; border:0px solid #A9A9A9; vertical-align:top;"|
 
{| id="mp-right" style="width:100%; vertical-align:top;"
 
|
 
  
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#d0e5f5; padding:0.2em 0.5em; font-weight:bold;"
+
<!--
 
+
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
|- valign=top
+
| width="696" |'''Funding Projects'''
+
|}
+
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
+
  
 
|
 
|
 
{|
 
{|
 
|- valign=top
 
|- valign=top
| width="140" |'''title''':
+
| width="100" |'''title''':
| width="558"|An Accurate Reliability Methodology for Appliance Electronic Cards
+
| width="450"|[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Logic Synthesis for Switching Lattices]]
 
|- valign="top"
 
|- valign="top"
| '''agency & program''':
+
| '''authors''':
| [http://www.tubitak.gov.tr/tr/destekler/akademik/ulusal-destek-programlari/icerik-1505-universite-sanayi-isbirligi-destek-programi TUBITAK University-Industry Collaboration Grant Program (1505)]
+
| [[Mustafa Altun]] and Marc Riedel
 
|- valign="top"
 
|- valign="top"
| '''budget''':
+
| '''appeared&nbsp;in''':
| 211.800 TL
+
| width="450"| [http://www.computer.org/portal/web/tc IEEE Transactions on Computers], Vol. 61, Issue 11, pp. 1588&ndash;1600, 2012.
 
|- valign="top"
 
|- valign="top"
| '''duration''':
+
| '''presented&nbsp;at''':
| 2013-2015, ''completed''
+
| [http://www.dac.com Design Automation Conference (DAC)], Anaheim, USA, 2010.
 
|}
 
|}
+
| align=center width="70" |
|}
+
<span class="plainlinks">
{| style="margin-left: auto; margin-right: 0px; border:1px solid #abd5f5; background:#f1f5fc;"
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/c/ca/Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf]]</span>
 +
<br>
 +
[[Media:Altun_Riedel_Logic_Synthesis_for_Switching_Lattices.pdf | Paper]]
 +
| align="center" width="70" |
 +
<span class="plainlinks">
  
|
+
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt]]
{|
+
</span>
|- valign="top"
+
<br> [http://www.ecc.itu.edu.tr/images/2/28/Altun_Riedel_Lattice-Based_Computation_of_Boolean_Functions.ppt Slides]
| width="140" |'''title''':
+
| width="558"|Gate Oxide Breakdown Failure Mechanism of CMOS Transistors
+
|- valign="top"
+
| '''agency & program''':
+
| [http://www.tubitak.gov.tr/tr/burslar/lisans/burs-programlari/icerik-2209-b-sanayi-odakli-lisans-bitirme-tezi-destekleme-programi TUBITAK Industry Oriented Senior Project Support Program (2241/A)]
+
|- valign="top"
+
| '''duration''':
+
| 2013-2014, ''completed''
+
 
|}
 
|}
+
-->
 
|}
 
|}
 +
| style="border:1px solid transparent;" |
 +
<!--        PROJE      -->
 +
  
 
|}
 
|}
 
|}
 
|}
|}
 
 
<!--        ANALOG      -->
 
  
  
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
|-
 
|-
| colspan="2" style="background:#8FBC8F; text-align:center; padding:1px; border-bottom:1px #8FBC8F solid;" |
+
| colspan="2" style="background:#8FBC8F; text-align:center; padding:1px; border-bottom:1px #8FBC9F solid;" |
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Analog Circuit Design </h2>
+
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Complete Synthesis Methodology </h2>
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
  
<h3>
+
Due to the stochastic nature
Positive Feedback</h3>
+
of nano-fabrication, nano arrays show different properties both
The conventional wisdom is that analog circuits should not include positive feedback loops. As controversial as it seems, we have successfully used '''positive feedback''' for impedance improvement in a current amplifier. With adding few transistors we have achieved very low input resistance values. Additionally, we have proposed a new fully-differential current amplifier and tested it in a filter application.
+
in structural and physical device levels compared to conventional
 +
technologies. Mentioned factors introduce random characteristics
 +
that need to be carefully considered by synthesis process. For instance, a competent synthesis methodology must consider basic
 +
technology preference for switching elements, defect or fault rates
 +
of the given nano switching array and the variation values as well
 +
as their effects on performance metrics including power, delay, and
 +
area. Presented synthesis methodology in this study comprehensively covers the all specified factors and provides optimization
 +
algorithms for each step of the process.
 +
 
 +
 
 +
[[Image:Research-synthesis-methodology.png|center|none|800px|link=]]
 +
 
  
 
<!--        YAYIN      -->
 
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| width="696" |'''Selected Publications'''
 
| width="696" |'''Selected Publications'''
 
|}
 
|}
 +
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
 
{| style="border:1px solid #abd5f5; background:#f1f5fc;"
  
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|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Altun_Kuntman_Design_of_a_Fully_Differential_Current_Mode_Operational_Amplifier_with_its_Filter_Applications.pdf | Design of a Fully Differential Current Mode Operational Amplifier with its Filter Applications]]
+
| width="450"|[[Media: Morgul_EtAl_Integrated_Synthesis_Methodology for_Crossbar_Arrays.pdf | Integrated Synthesis Methodology for Crossbar Arrays]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| [[Mustafa Altun]] and [http://web.itu.edu.tr/~kuntman/ Hakan Kuntman]
+
| width="450"| Ceylan Morgul, Luca Frontini, Onur Tunali, Ioana Vatajelu, Valentina Ciriani, Lorena Anghel, Csaba Moritz, Mircea Stan, Dan Alexandrescu, and Mustafa Altun
|- valign="top"
+
| '''appeared&nbsp;in''':
+
| [http://www.sciencedirect.com/science/journal/14348411 AEU International Journal of Electronics and Communications], <br>Vol. 62, Issue 3, pp. 39&ndash;44, 2008.
+
 
|- valign="top"
 
|- valign="top"
 
| '''presented&nbsp;at''':
 
| '''presented&nbsp;at''':
| [http://www.glsvlsi.org/ ACM Great Lakes Symposium on VLSI (GLSVLSI)], Stresa, Italy, 2007.
+
| width="450"|[http://www.nanoarch.org/ IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)], Athens, Greece, 2018.
 
|}
 
|}
 +
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/e/e5/Altun_Kuntman_Design_of_a_Fully_Differential_Current_Mode_Operational_Amplifier_with_its_Filter_Applications.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/b/b1/Morgul_EtAl_Integrated_Synthesis_Methodology_for_Crossbar_Arrays.pdf]]</span>
 
<br>
 
<br>
[[Media:Altun_Kuntman_Design_of_a_Fully_Differential_Current_Mode_Operational_Amplifier_with_its_Filter_Applications.pdf | Paper]]
+
[[Media: Morgul_EtAl_Integrated_Synthesis_Methodology_for_Crossbar_Arrays.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/7/77/Altun_Kuntman_A_Wideband_CMOS_Current-Mode_Operational_Amplifier_and_Its_Use_for_Band-Pass_Filter_Realization.ppt]]
+
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/b/bd/Morgul_EtAl_Integrated_Synthesis_Methodology_for_Crossbar_Arrays.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/7/77/Altun_Kuntman_A_Wideband_CMOS_Current-Mode_Operational_Amplifier_and_Its_Use_for_Band-Pass_Filter_Realization.ppt Slides]
+
<br> [http://www.ecc.itu.edu.tr/images/b/bd/Morgul_EtAl_Integrated_Synthesis_Methodology_for_Crossbar_Arrays.pptx Slides]
 
|}
 
|}
  
 
|}
 
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| style="border:1px solid transparent;" |
 
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{| id=portal cellspacing="0" cellpadding="0" width=100% style="border:1px solid #B8C7D9; padding:0px;"
 
|-
 
|-
| colspan="2" style="background:#8FBC7F; text-align:center; padding:1px; border-bottom:1px #8FBC7F solid;" |
+
| colspan="2" style="background:#8FBC7F; text-align:center; padding:1px; border-bottom:1px #8FBC8F solid;" |
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Discrete Mathematics </h2>
+
<h2 style="margin:.1em; border-bottom:1px; font-size:140%; font-weight:bold;"> Crossbar Memories </h2>
 
|-
 
|-
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
 
| valign="top" style="padding:8px 8px 0px 8px; background:#f5fffa;" <!--H210 S4 V100--> |
  
<h3>
+
In this work, we investigated the sensing challenges of spin-transfer torque MRAMs structured as nano-crossbar memories. To overcome
Self Duality Problem</h3>
+
the problems of reading this type of memory, we have proposed a voltage sensing amplifier topology and compared its
 +
performance to that of the current sensing amplifier in terms of power, speed, and bit error rate performance.
 +
 
 +
[[Image:Crossbar-memory.png|center|none|500px|link=]]
  
The problem of testing whether a monotone Boolean function in irredundant disjuntive normal form (IDNF) is self-dual is one of few problems in circuit/time complexity whose precise tractability status is '''unknown'''. We have focused on this '''famous problem'''. We have shown that monotone self-dual Boolean functions in IDNF do not have more variables than disjuncts. We have proposed an algorithm to test whether a monotone Boolean function in IDNF with ''n'' variables and ''n'' disjuncts is self-dual. The algorithm runs in O(n^3) time.
 
 
<!--        YAYIN      -->
 
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{| id="mp-upper" style="width: 100%; margin:4px 0 0 0; background:none; border-spacing: 0px;"
 
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|- valign=top
 
|- valign=top
 
| width="100" |'''title''':
 
| width="100" |'''title''':
| width="450"|[[Media:Altun_Riedel_A_Study_on_Monotone_Self_Dual_Boolean_Functions.pdf | A Study on Monotone Self-dual Boolean Functions]]
+
| width="450"|[[Media:Atasoyu_Altun_Ozoguz_Sensing_Schemes_for_STT-MRAMs.pdf | Sensing Schemes for STT-MRAMs structured with high TMR in low RA MTJs]]
 
|- valign="top"
 
|- valign="top"
 
| '''authors''':
 
| '''authors''':
| [[Mustafa Altun]] and [http://cadbio.com/wiki/index.php/Marc_Riedel Marc Riedel]
+
| Mesut Atasoyu, Mustafa Altun, Serdar Ozoguz, and Kaushik Roy
 
|- valign="top"
 
|- valign="top"
| '''appeared &nbsp;in''':
+
| '''appeared&nbsp;in''':
| [http://www.springer.com/mathematics/applications/journal/10255 Acta Mathematicae Applicatae Sinica - English Series], <br>Vol. 32, 2016.
+
| width="450"| [http://www.journals.elsevier.com/microelectronics-journal Microelectronics Journal], accepted for publication, 2019.
 +
|- valign="top"
 +
| '''presented&nbsp;at''':
 +
| width="450"| [http://smacd2017.unisa.it/ International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)], Taormina, Italy, 2017.
 
|}
 
|}
 
| align=center width="70" |
 
| align=center width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
[[File:PDF.png|65px|link=http://www.ecc.itu.edu.tr/images/5/53/Altun_Riedel_A_Study_on_Monotone_Self_Dual_Boolean_Functions.pdf]]</span>
+
[[File:PDF.png|65px|link=http://www.nanoxcomp.itu.edu.tr/images/a/af/Atasoyu_Altun_Ozoguz_Sensing_Schemes_for_STT-MRAMs.pdf]]</span>
 
<br>
 
<br>
[[Media:Altun_Riedel_A_Study_on_Monotone_Self_Dual_Boolean_Functions.pdf | Paper]]
+
[[Media:Atasoyu_Altun_Ozoguz_Sensing_Schemes_for_STT-MRAMs.pdf | Paper]]
 
| align="center" width="70" |
 
| align="center" width="70" |
 
<span class="plainlinks">
 
<span class="plainlinks">
  
[[File:PPT.jpg|60px|link=http://www.ecc.itu.edu.tr/images/1/18/Altun_Riedel_A_Study_on_Monotone_Self_Dual_Boolean_Functions.ppt]]
+
[[File:PPT.jpg|60px|link=http://www.nanoxcomp.itu.edu.tr/images/7/7a/Atasoyu_EtAl_Spin-Torque_Memristor_based_Offset_Cancellation.pptx]]
 
</span>
 
</span>
<br> [http://www.ecc.itu.edu.tr/images/1/18/Altun_Riedel_A_Study_on_Monotone_Self_Dual_Boolean_Functions.ppt Slides]
+
<br> [http://www.nanoxcomp.itu.edu.tr/images/7/7a/Atasoyu_EtAl_Spin-Torque_Memristor_based_Offset_Cancellation.pptx Slides]
 
|}
 
|}
  

Latest revision as of 18:00, 13 May 2019

We aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. Our objectives are 1) synthesizing Boolean functions with area optimization; 2) achieving fault tolerance; 3) performing performance optimization by considering area, delay, power, and accuracy; 4) implementing arithmetic and memory elements; and 5) realizing a synchronous state machine.

Contents

Logic Synthesis

We study implementation of Boolean functions with nano-crossbar arrays where each crosspoint behaves as a diode, a FET, and a four-terminal switch. For these three types, we give array size formulations for a given Boolean function. Additionally, we focus on four-terminal switch based implementations and propose an algorithm that implements Boolean functions with optimal array sizes.

Nanoarray logic synthesis.png


Selected Publications
title: Synthesis on Switching Lattices of Dimension-Reducible Boolean Functions
authors: Anna Bernasconi, Valentina Ciriani, Luca Frontini, and Gabriella Trucco
presented at: International Conference on Very Large Scale Integration (VLSI-SoC), Tallinn, Estonia, 2016

PDF.png
Paper

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Slides

title: Synthesis and Performance Optimization of a Switching Nano-crossbar Computer
authors: Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, and Mehdi Tahoori
presented at: Euromicro Conference on Digital System Design (DSD), Limassol, Cyprus, 2016.

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Paper

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Slides

Developed Tools
title: Optimal Synthesis Tool
authors: Ceylan Morgul and Mustafa Altun
description: Two optimal synthesis tools Tool-1 and Tool-2 are developed in Matlab and Python, respectively. Both tools aim to synthesize a given target Boolean functions with an optimal size of four-terminal switch based arrays .

ZIP.png
Tool


Fault Tolerance

We examine reconfigurable crossbar arrays by considering randomly occurred stuck-open and stuck-closed crosspoint faults. In the presence of permanent faults, a fast and accurate heuristic algorithm is proposed that uses the techniques of index sorting, backtracking, and row matching. In the presence of transient faults, tolerance analysis is performed by formally and recursively determining tolerable fault positions

Since density feature of crossbar architectures is the main attracting point, we perform a detailed yield analysis by considering both uniform and non-uniform defect distributions. We formalize an approximate successful mapping probability metric for uniform distributions and determine area overheads.

Nanoarray fault tolerance.png


Selected Publications
title: Permanent and Transient Fault Tolerance for Reconfigurable Nano-Crossbar Arrays
authors: Onur Tunali and Mustafa Altun
appeared in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 36, Issue 5, pp. 747–760, 2017.

PDF.png
Paper

title: Yield Analysis of Nano-Crossbar Arrays for Uniform and Clustered Defect Distributions
authors: Onur Tunali and Mustafa Altun
accepted at: IEEE International Conference on Electronics Circuits and Systems (ICECS), Batumi, Georgia, 2017.

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Paper

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Slides

Developed Tools
title: Fault Tolerant Logic Mapping Tool
authors: Onur Tunali and Mustafa Altun
description: The tool is developed in Matlab. It aims to map logic funtions into fault crossbars such that each crosspoint has an independent fault probability up to 20%.

ZIP.png
Tool

title: Yield Analysis Tool
authors: Onur Tunali and Mustafa Altun
description: The tool is developed in Matlab. This tool calculates the required crossbar size in advance according to a given logic function and a defect rate. Tool accepts two parameters, logic function file and defect rate as inputs and returns the size of crossbar.

ZIP.png
Tool


Performance Modeling and Analysis

We introduce an accurate capacitor-resistor model for nano-crossbar arrays that is to be used for power/delay/area performance analysis and optimization. In order to find capacitor and resistor values, we investigate upper/lower value limits for technology dependent parameters including doping concentration, nanowire dimension, pitch size, and layer thickness. We also use different fan-out capacitors to test the integration capability of these technologies.

Nanoarray RC modeling.png


Selected Publications
title: Power-Delay-Area Performance Modeling and Analysis for Nano-Crossbar Arrays
authors: Ceylan Morgul, Furkan Peker, and Mustafa Altun
presented at: IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Pittsburgh, USA, 2016.

PDF.png
Paper

PPT.jpg
Poster


Technology Development and Performance Optimization

Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures. Computing with crossbar arrays is achieved by its crosspoints behaving as switches, either two-terminal or four-terminal. Depending on the technology used, a two-terminal switch behaves as a diode, a resistive/memristive switch, or a field effect transistor (FET). On the other hand, a four-terminal switch has a unique behavior. While there have been many different technologies proposed for two-terminal switch based arrays, technology development for four-terminal switch based arrays, called switching lattices, has recently started.

For both two-terminal and four-terminal switch based arrays, we aim to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. We also aim to develeop CMOS-compatible technologies for crossbar arrays, specifically for switching lattices.

Research nano-2019.png

Technology Development

Although a four-terminal switch based array offers a significant area advantage, in terms of the number of switches, compared to the ones having two-terminal switches, its realization at the technology level needs further justifications and raises a number of questions about its feasibility. We answer these questions. First, by using three dimensional technology computer-aided design (TCAD) simulations, we show that four-terminal switches can be directly implemented with the CMOS technology. For this purpose, we try different semiconductor gate materials in different formations of geometric shapes. Then, by fitting the TCAD simulation data to the standard CMOS current-voltage equations, we develop a Spice model of a four-terminal switch. Finally, we successfully perform Spice circuit simulations on four-terminal switches with different sizes.

Research lattice technology.png

Performance Optimization

We study crossbar arrays including the memristive ones. We propose a defect-tolerant logic synthesis algorithms by considering area, delay, and power costs of the arrays.


Selected Publications
title: Realization of Four-Terminal Switching Lattices: Technology Development and Circuit Modeling
authors: Serzat Safaltin, Oguz Gencer, Ceylan Morgul, Levent Aksoy, Sebahattin Gurmen, Csaba Andras Moritz, and Mustafa Altun
presented at: Design, Automation and Test in Europe (DATE), Florence, Italy, 2019.

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Paper

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Slides

title: Defect Tolerant Logic Synthesis for Memristor Crossbars with Performance Evaluation
authors: Onur Tunali and Mustafa Altun
appeared in: IEEE Micro, Vol. 38, Issue 5, pp. 22–31, 2018.
presented at: Design, Automation and Test in Europe (DATE), Dresden, Germany, 2018.

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Paper

PPT.jpg
Slides

title: Logic Synthesis and Testing Techniques for Switching Nano-Crossbar Arrays
authors: Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, and Mehdi Tahoori
appeared in: Microprocessors and Microsystems, Vol. 54, pp. 14–25, 2017.
presented at: Euromicro Conference on Digital System Design (DSD), Limassol, Cyprus, 2016.

PDF.png
Paper

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Slides



Complete Synthesis Methodology

Due to the stochastic nature of nano-fabrication, nano arrays show different properties both in structural and physical device levels compared to conventional technologies. Mentioned factors introduce random characteristics that need to be carefully considered by synthesis process. For instance, a competent synthesis methodology must consider basic technology preference for switching elements, defect or fault rates of the given nano switching array and the variation values as well as their effects on performance metrics including power, delay, and area. Presented synthesis methodology in this study comprehensively covers the all specified factors and provides optimization algorithms for each step of the process.


Research-synthesis-methodology.png


Selected Publications
title: Integrated Synthesis Methodology for Crossbar Arrays
authors: Ceylan Morgul, Luca Frontini, Onur Tunali, Ioana Vatajelu, Valentina Ciriani, Lorena Anghel, Csaba Moritz, Mircea Stan, Dan Alexandrescu, and Mustafa Altun
presented at: IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Athens, Greece, 2018.

PDF.png
Paper

PPT.jpg
Slides


Crossbar Memories

In this work, we investigated the sensing challenges of spin-transfer torque MRAMs structured as nano-crossbar memories. To overcome the problems of reading this type of memory, we have proposed a voltage sensing amplifier topology and compared its performance to that of the current sensing amplifier in terms of power, speed, and bit error rate performance.

Crossbar-memory.png
Selected Publications
title: Sensing Schemes for STT-MRAMs structured with high TMR in low RA MTJs
authors: Mesut Atasoyu, Mustafa Altun, Serdar Ozoguz, and Kaushik Roy
appeared in: Microelectronics Journal, accepted for publication, 2019.
presented at: International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Taormina, Italy, 2017.

PDF.png
Paper

PPT.jpg
Slides

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